Silicon Wafers for Test Chips

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      "title": "Silicon Wafers for Test Chips",
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    "description": "As part of the existing Technology Development Element (TDE) contract with the European Space Agency (ESA), the Open University (OU), in company with Teledyne-e2v, are required to procure and test three experimental test chips for characterisation and testing.\nPhase 1: To procure Silicon wafers for the manufacture of Front Side Illuminated (FSI) soft X-ray Complementary Metal Oxide Semiconductor (CMOS) imaging detectors to characterise their Electro Optical (EO) performance both pre and post irradiation.\nPhase 2: A potential second phase subject to funding to process any remaining Silicon wafers from the first phase for the manufacture of Back Side Illuminated (BSI) soft X-ray CMOS imaging detectors to characterise their EO performance both pre and post irradiation.\nPhase 3: A potential third phase subject to funding to procure Silicon wafers to manufacture another batch of either FSI or BSI soft X-ray CMOS imaging detectors for further characterisation of their EO performance both pre and post irradiation.\nCost\nPhase 1: \u00a3220,000\nPhase 2: \u00a3250,000\nPhase 3: \u00a3350,00\nTotal: \u00a3820,000",
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    "title": "Silicon Wafers for Test Chips"
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